July 21, 2008
At last week’s tri-annual International X-Ray Microscopy meeting in Zurich, Bioengineering Alumnus Dr. Anne Sakdinawat was co-recipient of the prestigious Werner Meyer-Ilse Award for excellence in X-ray microscopy. The award is given to a young scientist whose work over the preceding three years represents an outstanding contribution to this field and it is presented at each occasion of the International Conference on X-Ray Microscopy. Anne was recognized for “the development of modified zone plates for phase contrast and high depth of focus applications.”
Anne has been a member of Lawrence Berkeley Lab Material Science Divisions Center for X- Ray Optics (CXRO) for the past five years. Her work was performed at Lawrence Berkeley Lab’s Advanced Light Source (ALS), with her advisor, David Attwood of the Lawrence Berkeley Laboratory, Professor in Residence of Electrical Engineering & Computer Sciences, and member of the Bioengineering Graduate Group.
For more about the award and conference visit the XRM 2008 site.